The uncomfortable truth behind the hype around 2D semiconductor performance

Duke University engineers discovered that a common laboratory testing method makes 2D semiconductors appear up to six times better than their actual performance in real-world conditions. The issue stems from "contact gating" in back-gated transistor designs, where electric fields artificially reduce resistance and inflate performance measurements. This testing flaw becomes more pronounced as devices shrink, potentially misleading researchers about the true potential of these ultrathin materials being developed as silicon alternatives for computer chips.